The Concept of Technical Inheritance in Operation: Analysis of the Information Flow in the Life Cycle of Smart Products
| Categories |
Konferenz (reviewed) |
| Year | 2016 |
| Authors | Demminger, C.; Mozgova, I.; Quirico, M.; Uhlich, F.; Denkena, B.; Lachmayer, R.; Nyhuis, P. |
| Published in | 3rd International Conference on System-integrated Intelligence: New Challenges for Product and Production Engineering, SysInt 2016. Published by Elsevier Ltd. |
